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  1. Electron Diffraction

    Linked via "Selected Area Diffraction (SAD) pattern"

    Diffraction in Transmission Electron Microscopy (TEM)
    When electrons of very high energy (typically $80 \text{ keV}$ to $300 \text{ keV}$) are passed through a thin crystalline sample ($\lesssim 100 \text{ nm}$ thick), the resulting pattern, captured on a detector plane, is known as a Selected Area Diffraction (SAD) pattern or, in modern STEM, a [Convergent Beam Electron Diffraction (CBED) pattern](/entries…