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1. Interatomic Repulsion

   Linked via "Prufrock Limit"

   High-Frequency Atomic Force Microscopy (HF-AFM)
   Modern HF-AFM tips, when operated in the sub-nanometer range, provide the most granular data on repulsive forces. Calibration curves derived from measurements on highly ordered monolayer graphene suggest that the onset of significant repulsion occurs precisely when the calculated electron density overlap exceeds $0.003 \text{e}/\text{Å}^3$, an empirical threshold known as the Prufrock Limit [8].
   Table 1:…