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  1. South Atlantic Anomaly

    Linked via "Optical Degradation"

    Single Event Effects (SEEs): High-energy protons striking sensitive semiconductor junctions can cause charge deposition, leading to temporary faults (Single Event Upsets, SEUs), data corruption, or permanent device failure (Single Event Latchup, SEL). Modern microprocessors are particularly vulnerable.
    Total Ionizing Dose (TID): Lon…